Faculty Research Interests and Selected Publications

 

Branimir Pejcinovic Branimir Pejcinovic Associate Professor

 


Phone: 503.725.5416
Fax: 503.725.3807
Email: brano@ece.pdx.edu
Office: FAB 160-08




Education
Ph.D. 1990, Electrical Engineering, University of Massachusetts, Amherst
M.S. 1986, Electrical Engineering, University of Massachusetts, Amherst
B.S. 1983, Electrical Engineering, University of Zagreb, Croatia

Research Interests
My research is centered on simulation of specific devices such as III-V compound HBTs and MESFETs, Silicon/Germanium devices and various models needed for their proper simulation. Within this area we are looking into a variety of effects and issues related to device operation and optimization. Tools used are finite-element and Monte-Carlo simulation programs, as well as SPICE-like programs.

There is constant need to compare simulation and experiments and to use simulation in devising better experiments or extracting the information from those experiments. This includes crystalline materials and devices as well as ploy-crystalline and amorphous ones.

We are currently working on modeling effective mobility in Si/Ge SOI MOSFETs while Sharp Microelectronic will be providing the experimental data for comparison. A SPICE model is also under development.

Another area of research is in modeling of microwave devices and circuits where we rely on H-P's program Microwave Design System. Currently we are looking into intermodulation performance of various devices.

Lastly, a new area of research is in progress dealing with noise properties of various photodetectors, fro p-i-n diodes to avalanche photodiodes to quantum well infrared detectors. The way to treat all of these devices in the same manner is by applying Monte Carlo simulation technique. It is a statistical method that directly solves Boltzmann transport equation and also provides means of calculating the fluctuations inside a device. A new Monte Carlo program is under development and will be used to study not only the noise properties but also the high-frequency/short pulse behavior of a variety of devices.

Selected Publications
P.K. Wong, B. Pejcinovic, J.J. Lee, S.T. Hsu, "Microwave Testing and Characterization of Strained Silicon SOI Technology," IEEE Int. Mixed-Signals Testing Workshop, 2004.

H. Xiao, R. Schaumann, W.R. Daasch, P.K. Wong, B. Pejcinovic, "A Radio-Frequency CMOS Active Inductor and Its Application in Designing High-Q Filters," Proc. IEEE Int. Symposium on Circuits and Systems, 2004.

V. Ceperic, A. Baric, B. Pejcinovic, "Artificial Neural Network in Modeling of Voltage Controlled Oscillators With Jitter," Proc. IEEE MELECON, 2004.

E. Sijercic, K. Mueller, B. Pejcinovic, "Drift-Diffusion Simulation of InSb Devices," Proc. IEEE MELECON, 2004.

E. Sijercic, K. Mueller, B. Pejcinovic, "Simulation of the Exclusion/Extraction InSb MOSFETs," IEEE Workshop on Microelectronics and Electron Devices, 2004.

J. Castelino, P. Wong, E. Sijercic, B. Pejcinovic, A. Baric, "Comparison of non-linear MESFET models over 1-12 GHz range," IEEE ICECS, 2003.


 

Jeff Hoffman & Don Tornquist have been chosen for the 2009-2010 ECE Undergraduate Honors Program. The program enables undergraduates to go beyond their normal studies to work with faculty in the area of their choice: research, entrepreneurship or innovation.

Robert Daasch

Dr. Robert Daasch has won the Semiconductor Research Corporation 2009 Technical Excellence Award. It is the second highest research award in the SRC. The Technical Excellence Award was established as an incentive and recognition program for research of exceptional value to GRC members. Authorized by the Board of Directors in December 1991, the award is intended to complement the Inventor Recognition Award. The Technical Excellence Award is shared among key contributors for innovative technology that significantly enhances the productivity/
competitiveness of the semiconductor industry. To date 25 research efforts have received the award. The 2008 Technical Excellence Award was presented to a team of researchers from Portland State University led by Professor W. Robert Daasch, and supported by students Liwei Ning (PhD 2009), and Amit Nahar (MS 2006) for their research, "Burn-in Reduction: Improving Outlier Screening".